Picture of SEM Zeiss Supra 35
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AVAILABLE
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Scanning Electron Microscope (SEM) for imaging. InLens, Secondary Electron and Backscattered Electron detectors available.

Tool name:
SEM Zeiss Supra 35
Area/room:
M2 F13 Analysis Lab
Category:
Characterization
Manufacturer:
Zeiss
Model:
Supra35

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