Scanning Electron Microscope (SEM) for imaging. Airlock for sample exchange. InLens and Secondary Electron (SE2) detectors are available.

Additional modules: Oxford Instruments EDX and Elphy Plus e-beam writer. EDX is normally available, e-beam not unless specifically needed.

Basic SEM training only on Supra35. After you start to be comfortable using Supra 35 SEM, you can apply for training on SEM/EDX/e-beam.