Picture of SEM Leo 1560
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Description

Scanning Electron Microscope (SEM) for imaging. Airlock for sample exchange. InLens and Secondary Electron (SE2) detectors are available.

Details
Tool name:
SEM Leo 1560
Area/room:
M2 F13 Analysis Lab
Category:
Characterization
Manufacturer:
Zeiss
Model:
LEO1560
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