Scanning Electron Microscope (SEM) for imaging. InLens, Secondary Electron and Backscattered Electron detectors available.
For new applicants: SEM introduction section every first Tuesday of each month from 13:00-15:00. Maximum 3 persons per section, in order of tool application. You will be contacted by the tool responsible after you make application. Make sure to check the SEM training guidelines and to discuss about your training with the SEM expert contact from your research group or company.