Picture of SEM Supra 35
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AVAILABLE
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Description

Scanning Electron Microscope (SEM) for imaging. InLens, Secondary electrons, Energy-dispersive X-ray spectroscopy (EDX) detectors available.

Details
Tool name:
SEM Supra 35
Area/room:
Polymer and Thin Film Laboratory
Category:
Characterization
Manufacturer:
Zeiss
Model:
Supra 35
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